Download An Engineer's Guide to Automated Testing of High-Speed by Jose Moreira PDF

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By Jose Moreira

Offering an entire advent to the state of the art in high-speed electronic checking out with computerized try out gear (ATE), this sensible source is the 1st publication to concentration completely in this more and more very important subject. that includes transparent examples, this one-stop reference covers all serious elements of the topic, from high-speed electronic fundamentals, ATE instrumentation for electronic functions, and try and measurements, to construction trying out, help instrumentation and textual content fixture layout.

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Extra info for An Engineer's Guide to Automated Testing of High-Speed Interfaces

Example text

These components of an I/O cell define the timing behavior of the high-speed signals under measurement and it is important for a test engineer to understand the characteristics of these circuits. 1 Phase Locked Loop (PLL) A phase locked loop is a circuit that aligns the signal phase of an oscillator contained in the PLL with the phase of a reference input signal [24]. Besides this phase alignment or clock synchronization functionality, another application area for PLLs is to derive clock signals that are synchronized to the provided reference signal but run at different frequencies than the reference signal.

Often signaling mechanisms that do not match the signaling used for normal data exchange of the respective high-speed I/O standard are applied to convey this information in such a case. These nonstandard signaling mechanisms are called out-of-band signaling. It has to be stressed that out-of-band signaling can be implemented very differently between the various high-speed I/O interfaces. 2 Data Eye Diagram The data eye diagram is a methodology to display and characterize a highspeed digital signal in the time domain.

The measurement setup uses a 10-bit pattern to compute the BER of the system. 2. 18 Simplistic example showing how the measured BER can be different from the “real BER” due to the used pattern. For measuring a DUT BER, one needs to be able to transmit bits to the DUT, find out if the transmitted bit was correctly received by the DUT, receive bits from the DUT, and find out if the received bits correspond to the intended bits to be transmitted by the DUT. 19 shows a block diagram of two possible measurement setups.

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